Centre for High Resolution Transmission Electron Microscopy

fib slice and view and 3d reconstruction of nickel converter matte

A tomography reconstruction of several serially sectioned slices using the slice and view facility of the FEI Helios 650 FIB SEM. The rectangular volume was sequentially sliced by the ion beam and the exposed cross sectional surface imaged in backscattered mode. Each section or slice was 20 nm apart and resulted in 246 images or slices. 3D reconstruction was done using the software packages ImageJ and Amira

hrtem and eels of carbon implanted diamond

absf-filtered-butterworth-hi-28-of-5


HRTEM micrograph at the end of range

GRAPHITE EELS SIGNAL

Signalgraphite

DIAMOND EELS SIGNAL

Signaldiamond

graphene research

proc1

False colour STEM image of metals atoms around a hole in graphene

quick contact

   Telephone: 

(041) 504 4283
(041) 504 2143                  


   Email:

chrtem@mandela.ac.za

General Enquiries (no bookings)

For general enquiries only. For booking requests visit our Access Link.

OK / Close