Centre for High Resolution Transmission Electron Microscopy
fib slice and view and 3d reconstruction of nickel converter matte
A tomography reconstruction of several serially sectioned slices using the slice and view facility of the FEI Helios 650 FIB SEM. The rectangular volume was sequentially sliced by the ion beam and the exposed cross sectional surface imaged in backscattered mode. Each section or slice was 20 nm apart and resulted in 246 images or slices. 3D reconstruction was done using the software packages ImageJ and Amira
hrtem and eels of carbon implanted diamond
HRTEM micrograph at the end of range
GRAPHITE EELS SIGNAL
DIAMOND EELS SIGNAL
graphene research
False colour STEM image of metals atoms around a hole in graphene
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