Centre for High Resolution Transmission Electron Microscopy

Nanoindenter and AFM

AFM and Nanoindenter

The nanoindenter tests selective mechanical properties such as hardness and elasticity of materials on the nanometer to micrometer scale using a Berkovich type tip.
 
The nanoindenter is equipped with an atomic force microscope (AFM) which is used to image the surface of materials on an atomic scale. It is used for high resolution topographic analysis, and provides a three-dimensional surface profile of a sample. The recorded data can be displayed using image processing software as brightness values or colour values for each pixel.
 

quick contact

   Telephone: 

(041) 504 4283
(041) 504 2143                  


   Email:

chrtem@mandela.ac.za

General Enquiries (no bookings)

For general enquiries only. For booking requests visit our Access Link.

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