Centre for High Resolution Transmission Electron Microscopy



Analytical FEG SEM

The JEOL JSM-7001F is an easy-to-use Schottky type FEG SEM. It is ideal for demanding analytical applications as well as those requiring high resolution (1.2 nm at 30 kV). The JSM-7001F has a large, 5-axis, fully eccentric, motorized, automated specimen stage. In addition to a secondary electron (SE) detector and a retractable back-scattered electron (BSE) detector, the SEM is also equipped with a number of analytical detectors including an energy dispersive spectrometer (EDS), a wavelength dispersive spectrometer (WDS) and an electron backscatter detector (EBSD). Analysis volumes down to a few tens of nm with high probe current at low voltages are achieved enabling high-speed EDS elemental analysis with high probe current, and trace elemental analysis with WDS. The backscattered electron detector is used for surface observation by separating compositional contrast and topographic contrast. High power optics provides high speed, high-accuracy EBSD characterization which is used to perform quantitative microstructure analysis from the millimetre to nanometre scale.


JEOL 7001F


ZnO hexagonal structure

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