Access
Research
News
Contact Us
search

Centre for High Resolution Transmission Electron Microscopy

MENU
Home about
Our Vision and Mission Our Services Our Sponsors Our Staff our students
Facilities
Microscopes
JEOL ARM 200F JEOL JEM 2100 LaB6 JEOL JSM 7001F FEI HELIOS Nanolab 650 FIB
Sample Preparation Other Equipment
Nano Indentation and Atomic Force Microscopy
Access research
Publications Collaborators Featured Research
News and Events opportunities
UNDERGRADUATE Postgraduate Postdoctoral
outreach
Facilities resources
videos Nanotechnology in SA Physics in SA What is materials science? Microscopy in SA
Contact
Back

NMMU Reasons to be Proud

Site Admin
 March 04, 2013
Comments (0)
NMMU Reasons to be Proud

Prof Jan Neethling (Director) and Prof Mike Lee (Manager) were featured in NMMU's Reasons to be Proud. Click here to download the post.

Back

Leave a comment

Keep me updated?

Comments are moderated.
Be the first person to comment.

Quick Navigation

Month:
Author:
Category:

Site Admin

quick contact

   Telephone: 

(041) 504 4283
(041) 504 2143                  


   Email:

chrtem@mandela.ac.za

facilities

JEOL ARM200F 

JEOL JEM 2100 LaB6 

JEOL JSM 7001F 

FEI Helios Nanolab 650 

Sample Preparation 

Nanoindentation 

Atomic Force Microscopy

About us

Our Vision and Mission

Our Services
Our Sponsors
Our Staff
Our Students

   

General Enquiries (no bookings)

For general enquiries only. For booking requests visit our Access Link.

Using this site means you accept its terms | Copyright © 2024    |   website by IT Design

OK / Close
Who doesn't like cookies?
This website uses cookies to ensure you get the best experience. Read more...
Accept and Close